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Subject: Re: [PATCH v4 0/3] test/dma: add vchan reconfig and SG tests
To: Gowrishankar Muthukrishnan <gmuthukrishn@marvell.com>, <dev@dpdk.org>
CC: <anoobj@marvell.com>, Vamsi Attunuru <vattunuru@marvell.com>, Amit Prakash
 Shukla <amitprakashs@marvell.com>, Vidya Sagar Velumuri
 <vvelumuri@marvell.com>, Kevin Laatz <kevin.laatz@intel.com>, Bruce
 Richardson <bruce.richardson@intel.com>
References: <cover.1699025423.git.gmuthukrishn@marvell.com>
 <cover.1699879558.git.gmuthukrishn@marvell.com>
From: fengchengwen <fengchengwen@huawei.com>
Message-ID: <0d34a18a-2a4e-d760-56e7-439d360702ae@huawei.com>
Date: Thu, 16 Nov 2023 15:16:22 +0800
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LGTM
Series-acked-by: Chengwen Feng <fengchengwen@huawei.com>

PS: since 'test/dma: fix for buffer auto free' already merged, I think you should resend v5 to fix the apply error.

On 2023/11/13 20:53, Gowrishankar Muthukrishnan wrote:
> This patch series reworks DMA tests to follow unit test framework
> followed by new vchan reconfig and SG tests.
> 
> v4:
>  - Suggestions from Fengchenwen addressed.
> 
> Gowrishankar Muthukrishnan (3):
>   test/dma: use unit test framework
>   test/dma: test multiple vchan
>   test/dma: add SG copy tests
> 
>  app/test/test_dmadev.c     | 374 +++++++++++++++++++++++++++++--------
>  app/test/test_dmadev_api.c | 316 +++++++++++++++++++++++--------
>  2 files changed, 534 insertions(+), 156 deletions(-)
>