Re: [PATCH 2/5] eal: add unit tests for bit operations

["Mattias Rönnblom" <hofors@lysator.liu.se>]

On 2024-08-09 17:03, Stephen Hemminger wrote:
> On Fri, 9 Aug 2024 11:04:36 +0200
> Mattias Rönnblom <mattias.ronnblom@ericsson.com> wrote:
> 
>> -uint32_t val32;
>> -uint64_t val64;
>> +#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
>> +			    flip_fun, test_fun, size)			\
>> +	static int							\
>> +	test_name(void)							\
>> +	{								\
>> +		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
>> +		unsigned int bit_nr;					\
>> +		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
>> +									\
>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>> +			bool assign = rte_rand() & 1;			\
>> +			if (assign)					\
>> +				assign_fun(&word, bit_nr, reference_bit); \
>> +			else {						\
>> +				if (reference_bit)			\
>> +					set_fun(&word, bit_nr);		\
>> +				else					\
>> +					clear_fun(&word, bit_nr);	\
>> +									\
>> +			}						\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +			flip_fun(&word, bit_nr);			\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
>> +				    "Bit %d had unflipped value", bit_nr); \
>> +			flip_fun(&word, bit_nr);			\
>> +									\
>> +			const uint ## size ## _t *const_ptr = &word;	\
>> +			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
>> +				    reference_bit,			\
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +		}							\
>> +									\
>> +		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
>> +			bool reference_bit = (reference >> bit_nr) & 1;	\
>> +			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
>> +				    "Bit %d had unexpected value", bit_nr); \
>> +		}							\
>> +									\
>> +		TEST_ASSERT(reference == word, "Word had unexpected value"); \
>> +									\
>> +		return TEST_SUCCESS;					\
>> +	}
>> +
>> +GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
>> +
>> +GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
>> +		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)
> 
> Having large macro like this for two cases adds complexity without
> additional clarity. Just duplicate the code please.

GEN_TEST_BIT_ACCESS is being used by six more test cases in later 
patches in the series.