[dpdk-dev] [PATCH] test/ring: add stress test for ST peek API

[Konstantin Ananyev <konstantin.ananyev@intel.com>]

Introduce new test case to test ST peek API.

Signed-off-by: Konstantin Ananyev <konstantin.ananyev@intel.com>
---

This patch depends on the following patch:
"ring: fix error vlaue of tail in the peek API for ST mode"
(http://patches.dpdk.org/patch/72374/)
to run successfully.

 app/test/Makefile                   |  1 +
 app/test/meson.build                |  1 +
 app/test/test_ring_st_peek_stress.c | 54 +++++++++++++++++++++++++++++
 app/test/test_ring_stress.c         |  3 ++
 app/test/test_ring_stress.h         |  1 +
 5 files changed, 60 insertions(+)
 create mode 100644 app/test/test_ring_st_peek_stress.c

diff --git a/app/test/Makefile b/app/test/Makefile
index 7b96a03a6..37bdaf891 100644
--- a/app/test/Makefile
+++ b/app/test/Makefile
@@ -83,6 +83,7 @@ SRCS-y += test_ring_hts_stress.c
 SRCS-y += test_ring_perf.c
 SRCS-y += test_ring_peek_stress.c
 SRCS-y += test_ring_rts_stress.c
+SRCS-y += test_ring_st_peek_stress.c
 SRCS-y += test_ring_stress.c
 SRCS-y += test_pmd_perf.c
 
diff --git a/app/test/meson.build b/app/test/meson.build
index 5233ead46..4ec7da6b2 100644
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -108,6 +108,7 @@ test_sources = files('commands.c',
 	'test_ring_peek_stress.c',
 	'test_ring_perf.c',
 	'test_ring_rts_stress.c',
+	'test_ring_st_peek_stress.c',
 	'test_ring_stress.c',
 	'test_rwlock.c',
 	'test_sched.c',
diff --git a/app/test/test_ring_st_peek_stress.c b/app/test/test_ring_st_peek_stress.c
new file mode 100644
index 000000000..bc573de47
--- /dev/null
+++ b/app/test/test_ring_st_peek_stress.c
@@ -0,0 +1,54 @@
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright(c) 2020 Intel Corporation
+ */
+
+#include "test_ring_stress_impl.h"
+#include <rte_ring_elem.h>
+
+static inline uint32_t
+_st_ring_dequeue_bulk(struct rte_ring *r, void **obj, uint32_t n,
+	uint32_t *avail)
+{
+	uint32_t m;
+
+	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
+
+	rte_spinlock_lock(&lck);
+
+	m = rte_ring_dequeue_bulk_start(r, obj, n, avail);
+	n = (m == n) ? n : 0;
+	rte_ring_dequeue_finish(r, n);
+
+	rte_spinlock_unlock(&lck);
+	return n;
+}
+
+static inline uint32_t
+_st_ring_enqueue_bulk(struct rte_ring *r, void * const *obj, uint32_t n,
+	uint32_t *free)
+{
+	uint32_t m;
+
+	static rte_spinlock_t lck = RTE_SPINLOCK_INITIALIZER;
+
+	rte_spinlock_lock(&lck);
+
+	m = rte_ring_enqueue_bulk_start(r, n, free);
+	n = (m == n) ? n : 0;
+	rte_ring_enqueue_finish(r, obj, n);
+
+	rte_spinlock_unlock(&lck);
+	return n;
+}
+
+static int
+_st_ring_init(struct rte_ring *r, const char *name, uint32_t num)
+{
+	return rte_ring_init(r, name, num, RING_F_SP_ENQ | RING_F_SC_DEQ);
+}
+
+const struct test test_ring_st_peek_stress = {
+	.name = "ST_PEEK",
+	.nb_case = RTE_DIM(tests),
+	.cases = tests,
+};
diff --git a/app/test/test_ring_stress.c b/app/test/test_ring_stress.c
index 853fcc190..387cfa747 100644
--- a/app/test/test_ring_stress.c
+++ b/app/test/test_ring_stress.c
@@ -49,6 +49,9 @@ test_ring_stress(void)
 	n += test_ring_peek_stress.nb_case;
 	k += run_test(&test_ring_peek_stress);
 
+	n += test_ring_st_peek_stress.nb_case;
+	k += run_test(&test_ring_st_peek_stress);
+
 	printf("Number of tests:\t%u\nSuccess:\t%u\nFailed:\t%u\n",
 		n, k, n - k);
 	return (k != n);
diff --git a/app/test/test_ring_stress.h b/app/test/test_ring_stress.h
index 60953ce47..a9a390341 100644
--- a/app/test/test_ring_stress.h
+++ b/app/test/test_ring_stress.h
@@ -36,3 +36,4 @@ extern const struct test test_ring_mpmc_stress;
 extern const struct test test_ring_rts_stress;
 extern const struct test test_ring_hts_stress;
 extern const struct test test_ring_peek_stress;
+extern const struct test test_ring_st_peek_stress;
-- 
2.17.1