Re: [dpdk-dev] [PATCH v5 3/5] test/hash: add additional thash tests

[Stanislaw Kardach <kda@semihalf.com>]

On Thu, Apr 29, 2021 at 12:17:08PM +0300, Medvedkin, Vladimir wrote:
<snip>
> > Test Failed
> > RTE>>
> > --- stderr ---
> > EAL: Detected 2 lcore(s)
> > EAL: Detected 1 NUMA nodes
> > EAL: Detected shared linkage of DPDK
> > EAL: Multi-process socket /var/run/dpdk/thash_autotest/mp_socket
> > EAL: Selected IOVA mode 'PA'
> > EAL: No available 1048576 kB hugepages reported
> > EAL: VFIO support initialized
> > APP: HPET is not enabled, using TSC as default timer
> > HASH: Can't add helper  due to conflict with existing helper second_range
> > HASH: Can't generate m-sequence due to period overflow
> > EAL: Test assert test_adjust_tuple line 559 failed: can not adjust
> > tuple, ret -17
> > 

I can see the same issue on my side. Happening randomly, more often on a
RISC-V target than on my laptop (i5-10210U). Though the reproduction
seems to be a lot of patience and the following:

  meson test --repeat 100000 DPDK:fast-tests / thash_autotest

I wonder if it can be related to the desired_value in test_adjust_tuple
being a randomized value without setting the seed prior to the test?
I haven't analyzed the code in-depth but it seems that the
rte_thash_add_helper() also uses a random lfsr which is then used in the
subkey generation. Could this contribute to the randomness of the issue?

-- 
Best Regards,
Stanislaw Kardach