[PATCH v6 3/6] eal: add unit tests for bit operations

["Mattias Rönnblom" <mattias.ronnblom@ericsson.com>]

Extend bitops tests to cover the
rte_bit_[test|set|clear|assign|flip]()
functions.

The tests are converted to use the test suite runner framework.

Signed-off-by: Mattias Rönnblom <mattias.ronnblom@ericsson.com>
Acked-by: Morten Brørup <mb@smartsharesystems.com>
Acked-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
Acked-by: Jack Bond-Preston <jack.bond-preston@foss.arm.com>

--

RFC v6:
 * Test rte_bit_*test() usage through const pointers.

RFC v4:
 * Remove redundant line continuations.
---
 app/test/test_bitops.c | 85 ++++++++++++++++++++++++++++++++++--------
 1 file changed, 70 insertions(+), 15 deletions(-)

diff --git a/app/test/test_bitops.c b/app/test/test_bitops.c
index 0d4ccfb468..322f58c066 100644
--- a/app/test/test_bitops.c
+++ b/app/test/test_bitops.c
@@ -1,13 +1,68 @@
 /* SPDX-License-Identifier: BSD-3-Clause
  * Copyright(c) 2019 Arm Limited
+ * Copyright(c) 2024 Ericsson AB
  */
 
+#include <stdbool.h>
+
 #include <rte_launch.h>
 #include <rte_bitops.h>
+#include <rte_random.h>
 #include "test.h"
 
-uint32_t val32;
-uint64_t val64;
+#define GEN_TEST_BIT_ACCESS(test_name, set_fun, clear_fun, assign_fun,	\
+			    flip_fun, test_fun, size)			\
+	static int							\
+	test_name(void)							\
+	{								\
+		uint ## size ## _t reference = (uint ## size ## _t)rte_rand(); \
+		unsigned int bit_nr;					\
+		uint ## size ## _t word = (uint ## size ## _t)rte_rand(); \
+									\
+		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
+			bool reference_bit = (reference >> bit_nr) & 1;	\
+			bool assign = rte_rand() & 1;			\
+			if (assign)					\
+				assign_fun(&word, bit_nr, reference_bit); \
+			else {						\
+				if (reference_bit)			\
+					set_fun(&word, bit_nr);		\
+				else					\
+					clear_fun(&word, bit_nr);	\
+									\
+			}						\
+			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
+				    "Bit %d had unexpected value", bit_nr); \
+			flip_fun(&word, bit_nr);			\
+			TEST_ASSERT(test_fun(&word, bit_nr) != reference_bit, \
+				    "Bit %d had unflipped value", bit_nr); \
+			flip_fun(&word, bit_nr);			\
+									\
+			const uint ## size ## _t *const_ptr = &word;	\
+			TEST_ASSERT(test_fun(const_ptr, bit_nr) ==	\
+				    reference_bit,			\
+				    "Bit %d had unexpected value", bit_nr); \
+		}							\
+									\
+		for (bit_nr = 0; bit_nr < size; bit_nr++) {		\
+			bool reference_bit = (reference >> bit_nr) & 1;	\
+			TEST_ASSERT(test_fun(&word, bit_nr) == reference_bit, \
+				    "Bit %d had unexpected value", bit_nr); \
+		}							\
+									\
+		TEST_ASSERT(reference == word, "Word had unexpected value"); \
+									\
+		return TEST_SUCCESS;					\
+	}
+
+GEN_TEST_BIT_ACCESS(test_bit_access32, rte_bit_set, rte_bit_clear,
+		    rte_bit_assign, rte_bit_flip, rte_bit_test, 32)
+
+GEN_TEST_BIT_ACCESS(test_bit_access64, rte_bit_set, rte_bit_clear,
+		    rte_bit_assign, rte_bit_flip, rte_bit_test, 64)
+
+static uint32_t val32;
+static uint64_t val64;
 
 #define MAX_BITS_32 32
 #define MAX_BITS_64 64
@@ -117,22 +172,22 @@ test_bit_relaxed_test_set_clear(void)
 	return TEST_SUCCESS;
 }
 
+static struct unit_test_suite test_suite = {
+	.suite_name = "Bitops test suite",
+	.unit_test_cases = {
+		TEST_CASE(test_bit_access32),
+		TEST_CASE(test_bit_access64),
+		TEST_CASE(test_bit_relaxed_set),
+		TEST_CASE(test_bit_relaxed_clear),
+		TEST_CASE(test_bit_relaxed_test_set_clear),
+		TEST_CASES_END()
+	}
+};
+
 static int
 test_bitops(void)
 {
-	val32 = 0;
-	val64 = 0;
-
-	if (test_bit_relaxed_set() < 0)
-		return TEST_FAILED;
-
-	if (test_bit_relaxed_clear() < 0)
-		return TEST_FAILED;
-
-	if (test_bit_relaxed_test_set_clear() < 0)
-		return TEST_FAILED;
-
-	return TEST_SUCCESS;
+	return unit_test_suite_runner(&test_suite);
 }
 
 REGISTER_FAST_TEST(bitops_autotest, true, true, test_bitops);
-- 
2.34.1