From mboxrd@z Thu Jan 1 00:00:00 1970 Return-Path: Received: from mga09.intel.com (mga09.intel.com [134.134.136.24]) by dpdk.org (Postfix) with ESMTP id 283234F91 for ; Wed, 17 Oct 2018 15:33:27 +0200 (CEST) X-Amp-Result: SKIPPED(no attachment in message) X-Amp-File-Uploaded: False Received: from orsmga003.jf.intel.com ([10.7.209.27]) by orsmga102.jf.intel.com with ESMTP/TLS/DHE-RSA-AES256-GCM-SHA384; 17 Oct 2018 06:33:26 -0700 X-ExtLoop1: 1 X-IronPort-AV: E=Sophos;i="5.54,392,1534834800"; d="scan'208";a="92750527" Received: from irsmsx152.ger.corp.intel.com ([163.33.192.66]) by orsmga003.jf.intel.com with ESMTP; 17 Oct 2018 06:33:26 -0700 Received: from irsmsx110.ger.corp.intel.com ([169.254.15.182]) by IRSMSX152.ger.corp.intel.com ([169.254.6.110]) with mapi id 14.03.0319.002; Wed, 17 Oct 2018 14:33:25 +0100 From: "Pattan, Reshma" To: "Parthasarathy, JananeeX M" , "dev@dpdk.org" CC: "Marohn, Byron" , "De Lara Guarch, Pablo" Thread-Topic: [PATCH] test: reduce test duration for efd autotest Thread-Index: AQHUVaP2IJGJgh964EiyIwPgfWXH2aUjiuGw Date: Wed, 17 Oct 2018 13:33:24 +0000 Message-ID: <3AEA2BF9852C6F48A459DA490692831F2A3B990E@irsmsx110.ger.corp.intel.com> References: <1537971540-31443-1-git-send-email-jananeex.m.parthasarathy@intel.com> In-Reply-To: <1537971540-31443-1-git-send-email-jananeex.m.parthasarathy@intel.com> Accept-Language: en-US Content-Language: en-US X-MS-Has-Attach: X-MS-TNEF-Correlator: dlp-product: dlpe-windows dlp-version: 11.0.200.100 dlp-reaction: no-action x-originating-ip: [163.33.239.180] Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: quoted-printable MIME-Version: 1.0 Subject: Re: [dpdk-dev] [PATCH] test: reduce test duration for efd autotest X-BeenThere: dev@dpdk.org X-Mailman-Version: 2.1.15 Precedence: list List-Id: DPDK patches and discussions List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , X-List-Received-Date: Wed, 17 Oct 2018 13:33:28 -0000 > -----Original Message----- > From: Parthasarathy, JananeeX M > Sent: Wednesday, September 26, 2018 3:19 PM > To: dev@dpdk.org >=20 > struct rte_efd_table *handle =3D NULL; > uint32_t num_rules_in =3D TABLE_SIZE; > - uint8_t simple_key[EFD_TEST_KEY_LEN]; You need to remove EFD_TEST_KEY_LEN macro from the code now, as it is not i= s not used now. Also seems like they want to use the key of length 8 bytes as per this test= . But after your changes we are going to have one byte key , so is the test b= ehaving same before and after this key change? =20 > + val =3D mrand48() & VALUE_BITMASK; Can we use rte_rand() here instead of mrand48()?=20 What was the reason for using mrand8()? Thanks, Reshma