From mboxrd@z Thu Jan 1 00:00:00 1970 Return-Path: Received: from mga01.intel.com (mga01.intel.com [192.55.52.88]) by dpdk.org (Postfix) with ESMTP id 4D55B7CBC for ; Wed, 17 Oct 2018 16:34:16 +0200 (CEST) X-Amp-Result: SKIPPED(no attachment in message) X-Amp-File-Uploaded: False Received: from fmsmga008.fm.intel.com ([10.253.24.58]) by fmsmga101.fm.intel.com with ESMTP/TLS/DHE-RSA-AES256-GCM-SHA384; 17 Oct 2018 07:34:15 -0700 X-ExtLoop1: 1 X-IronPort-AV: E=Sophos;i="5.54,392,1534834800"; d="scan'208";a="79474212" Received: from irsmsx153.ger.corp.intel.com ([163.33.192.75]) by fmsmga008.fm.intel.com with ESMTP; 17 Oct 2018 07:34:14 -0700 Received: from irsmsx110.ger.corp.intel.com ([169.254.15.182]) by IRSMSX153.ger.corp.intel.com ([169.254.9.121]) with mapi id 14.03.0319.002; Wed, 17 Oct 2018 15:34:14 +0100 From: "Pattan, Reshma" To: "Parthasarathy, JananeeX M" , "dev@dpdk.org" CC: "Marohn, Byron" , "De Lara Guarch, Pablo" Thread-Topic: [PATCH] test: reduce test duration for efd autotest Thread-Index: AQHUVaP2IJGJgh964EiyIwPgfWXH2aUjntWg Date: Wed, 17 Oct 2018 14:34:12 +0000 Message-ID: <3AEA2BF9852C6F48A459DA490692831F2A3B9964@irsmsx110.ger.corp.intel.com> References: <1537971540-31443-1-git-send-email-jananeex.m.parthasarathy@intel.com> In-Reply-To: <1537971540-31443-1-git-send-email-jananeex.m.parthasarathy@intel.com> Accept-Language: en-US Content-Language: en-US X-MS-Has-Attach: X-MS-TNEF-Correlator: dlp-product: dlpe-windows dlp-version: 11.0.200.100 dlp-reaction: no-action x-originating-ip: [163.33.239.180] Content-Type: text/plain; charset="us-ascii" Content-Transfer-Encoding: quoted-printable MIME-Version: 1.0 Subject: Re: [dpdk-dev] [PATCH] test: reduce test duration for efd autotest X-BeenThere: dev@dpdk.org X-Mailman-Version: 2.1.15 Precedence: list List-Id: DPDK patches and discussions List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , X-List-Received-Date: Wed, 17 Oct 2018 14:34:16 -0000 > -----Original Message----- > From: Parthasarathy, JananeeX M > Sent: Wednesday, September 26, 2018 3:19 PM > To: dev@dpdk.org > Cc: Marohn, Byron ; De Lara Guarch, Pablo > ; Pattan, Reshma > ; Parthasarathy, JananeeX M > > Subject: [PATCH] test: reduce test duration for efd autotest >=20 > + uint8_t simple_key; Following to my comments in my earlier mail, Can this be uint64_t simple-key; ? so that we can retain simple_key to be o= f 64 bits as per original test case. > efd_get_all_sockets_bitmask(), > + sizeof(uint8_t), sizeof(simple_key); > + val =3D mrand48() & VALUE_BITMASK; Having value here can make all has key entries to have same value. But as per original test case, they want to have different value for each hash key entry. So better move val update inside for loop itself. > /* Add random entries until key cannot be added */ > for (added_keys =3D 0; added_keys < num_rules_in; > added_keys++) { >=20 > - for (i =3D 0; i < EFD_TEST_KEY_LEN; i++) > - simple_key[i] =3D rte_rand() & 0xFF; > + simple_key =3D rte_rand() & 0xFF; If we agree to change simple_key to be of type unit64_t then masking with 0= xFF will not be required here. Instead of having val =3D mrand48() & VALUE_BITMASK; as above. Now you can= do val =3D simple_key & 0xFF; =20 So for each key that is going to be updated we will have different value as= per original test. >=20 > - efd_value_t val =3D simple_key[0]; > - > - if (rte_efd_update(handle, test_socket_id, > simple_key, > + if (rte_efd_update(handle, test_socket_id, > &simple_key, Thanks, Reshma