Re: DPDK Release Status Meeting 2023-11-23

[Ruifeng Wang <Ruifeng.Wang@arm.com>]

On 2023/11/28 1:16 AM, Stephen Hemminger wrote:
> On Mon, 27 Nov 2023 11:13:16 +0100
> Thomas Monjalon <thomas@monjalon.net> wrote:
> 
>> ish.
>>>>>
>>>>> Due to a relative bigger RTE_MAX_LCORE value on ARM, the unit test case
>>>>> would take a longer time to finish iterations.
>>>>> In one of my run, the case took about 100s.
>>>>
>>>> Right, but this test is part of the "fast suite", and more than a
>>>> minute is not exactly fast. So one of the following should ideally
>>>> happen:
>>>
>>> Agree.
>>>    
>>>> 1) Test is moved out of the fast suite
>>>> 2) Test has its individual timeout sized appropriately so that it
>>>> never fails regardless of the environment
>>>> 3) Test is capped so that it doesn't grow with the number of cores
>>>> without limits
>>>
>>> I'm for option 3. The case should be kept in fast suite. Time taken
>>> should be capped.
>>
>> More than 1 second is a bit slow.
>> Please make the test really faster.
> 
> What is the test trying to exercise? Can it be done in another way?

The time consuming part is non-EAL test. It creates non-EAL threads 
until filling up RTE_MAX_LCORE.

This part can be a separate case outside of fast suite.