Re: [dpdk-dev] [EXT] [PATCH v2 2/5] test/event: add unit test for event buffer size config api

[Pavan Nikhilesh Bhagavatula <pbhagavatula@marvell.com>]

>this patch adds unit test for
>rte_event_eth_rx_adapter_create_with_params
>api and validate all possible input combinations.
>
>Signed-off-by: Naga Harish K S V <s.v.naga.harish.k@intel.com>
>---
> app/test/test_event_eth_rx_adapter.c | 53
>+++++++++++++++++++++++++---
> 1 file changed, 49 insertions(+), 4 deletions(-)
>
>diff --git a/app/test/test_event_eth_rx_adapter.c
>b/app/test/test_event_eth_rx_adapter.c
>index add4d8a678..3c0f0ad7cc 100644
>--- a/app/test/test_event_eth_rx_adapter.c
>+++ b/app/test/test_event_eth_rx_adapter.c
>@@ -428,6 +428,50 @@ adapter_create_free(void)
> 	return TEST_SUCCESS;
> }
>
>+static int
>+adapter_create_free_v2(void)
>+{
>+	int err;
>+
>+	struct rte_event_port_conf rx_p_conf = {
>+			.dequeue_depth = 8,
>+			.enqueue_depth = 8,
>+			.new_event_threshold = 1200,
>+	};
>+
>+	struct rte_event_eth_rx_adapter_params rxa_params = {
>+			.event_buf_size = 1024
>+	};
>+
>+	err =
>rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
>+				TEST_DEV_ID, NULL, NULL);
>+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
>+
>+	err =
>rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
>+				TEST_DEV_ID, &rx_p_conf,
>&rxa_params);
>+	TEST_ASSERT(err == 0, "Expected 0 got %d", err);
>+
>+	err =
>rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
>+				TEST_DEV_ID, &rx_p_conf,
>&rxa_params);
>+	TEST_ASSERT(err == -EEXIST, "Expected -EEXIST %d got %d", -
>EEXIST, err);
>+
>+	rxa_params.event_buf_size = 0;
>+	err =
>rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
>+				TEST_DEV_ID, &rx_p_conf,
>&rxa_params);
>+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
>+
>+	err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
>+	TEST_ASSERT(err == 0, "Expected 0 got %d", err);
>+
>+	err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
>+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -
>EINVAL, err);
>+
>+	err = rte_event_eth_rx_adapter_free(1);
>+	TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -
>EINVAL, err);
>+
>+	return TEST_SUCCESS;
>+}
>+
> static int
> adapter_queue_add_del(void)
> {
>@@ -435,7 +479,7 @@ adapter_queue_add_del(void)
> 	struct rte_event ev;
> 	uint32_t cap;
>
>-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
>+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
>{0};
>
> 	err = rte_event_eth_rx_adapter_caps_get(TEST_DEV_ID,
>TEST_ETHDEV_ID,
> 					 &cap);
>@@ -523,7 +567,7 @@ adapter_multi_eth_add_del(void)
> 	uint16_t port_index, port_index_base, drv_id = 0;
> 	char driver_name[50];
>
>-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
>+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
>{0};
>
> 	ev.queue_id = 0;
> 	ev.sched_type = RTE_SCHED_TYPE_ATOMIC;
>@@ -594,7 +638,7 @@ adapter_intr_queue_add_del(void)
> 	struct rte_event ev;
> 	uint32_t cap;
> 	uint16_t eth_port;
>-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
>+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
>{0};
>
> 	if (!default_params.rx_intr_port_inited)
> 		return 0;
>@@ -687,7 +731,7 @@ adapter_start_stop(void)
> 	ev.sched_type = RTE_SCHED_TYPE_ATOMIC;
> 	ev.priority = 0;
>
>-	struct rte_event_eth_rx_adapter_queue_conf queue_config;
>+	struct rte_event_eth_rx_adapter_queue_conf queue_config =
>{0};
>
> 	queue_config.rx_queue_flags = 0;
> 	if (default_params.caps &
>@@ -753,6 +797,7 @@ static struct unit_test_suite event_eth_rx_tests
>= {
> 	.teardown = testsuite_teardown,
> 	.unit_test_cases = {
> 		TEST_CASE_ST(NULL, NULL, adapter_create_free),
>+		TEST_CASE_ST(NULL, NULL, adapter_create_free_v2),

Please use a meaningful function name. In case of failure I don't thing "v2" will gave any meaning

> 		TEST_CASE_ST(adapter_create, adapter_free,
> 					adapter_queue_add_del),
> 		TEST_CASE_ST(adapter_create, adapter_free,
>--
>2.25.1