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From: bugzilla@dpdk.org
To: dev@dpdk.org
Subject: [DPDK/eventdev Bug 1423] Using -fno-strict-aliasing when compiling
DPDK unit tests reduces their effectiveness
Date: Sun, 28 Apr 2024 07:29:09 +0000
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--17142893500.FBBD1A07D.723978
Date: Sun, 28 Apr 2024 09:29:10 +0200
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https://bugs.dpdk.org/show_bug.cgi?id=3D1423
Bug ID: 1423
Summary: Using -fno-strict-aliasing when compiling DPDK unit
tests reduces their effectiveness
Product: DPDK
Version: 23.11
Hardware: All
OS: All
Status: UNCONFIRMED
Severity: normal
Priority: Normal
Component: eventdev
Assignee: dev@dpdk.org
Reporter: mattias.ronnblom@ericsson.com
Target Milestone: ---
6b89650418f adds
+# Strict-aliasing rules are violated by uint8_t[] to context size casts.
+CFLAGS +=3D -fno-strict-aliasing
to app/test/meson.build.
This flag applies to all tests, not just the broken RTE graph tests (or SUT=
?).
Passing this flag to the compiler will prevent any functional tests (of any
component) from detecting any aliasing-related bugs found in code located in
SUT header files.
RTE graph should be fixed, rather than a whole-sale application of this
work-around to DPDK test suite.
In additional, reducing the level of compiler optimization will make the pe=
rf
test less relevant.
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--17142893500.FBBD1A07D.723978
Date: Sun, 28 Apr 2024 09:29:10 +0200
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Using -fno-strict-aliasing when compiling DPDK unit tests red=
uces their effectiveness
Product
DPDK
Version
23.11
Hardware
All
OS
All
Status
UNCONFIRMED
Severity
normal
Priority
Normal
Component
eventdev
Assignee
dev@dpdk.org
Reporter
mattias.ronnblom@ericsson.com
Target Milestone
---
6b89650418f adds
+# Strict-aliasing rules are violated by uint8_t[] to context size casts.
+CFLAGS +=3D -fno-strict-aliasing
to app/test/meson.build.
This flag applies to all tests, not just the broken RTE graph tests (or SUT=
?).
Passing this flag to the compiler will prevent any functional tests (of any
component) from detecting any aliasing-related bugs found in code located in
SUT header files.
RTE graph should be fixed, rather than a whole-sale application of this
work-around to DPDK test suite.
In additional, reducing the level of compiler optimization will make the pe=
rf
test less relevant.