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To: Herbert Guan <herbert.guan@arm.com>, dev@dpdk.org,
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From: Ferruh Yigit <ferruh.yigit@intel.com>
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Date: Tue, 18 Jul 2017 17:13:54 +0100
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Subject: Re: [dpdk-dev] [PATCH v2] test: Fix memory corruption issues which
 fails the link_bonding test.
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On 7/10/2017 12:13 PM, Herbert Guan wrote:
> Patch V2: fix build warnings by deleting unused variables. 
> 
> There were double-free problems in some test cases, which will cause
> a duplicated mbuf will be added into mempool.  After double-free, 
> some new allocated mbuf will hold a same address and thus cause the 
> memory corruption.
> 
> Another minor issue is that in some test cases, allocated mbuf will
> not be released after test case exits.  Hopefully these leaked mbuf
> will be released by the next test case in its setup phase when
> stopping the virtual pmd ports, while this do is a memory leak of
> the exited test case.
> 
> To fix above 2 issues, this patch will do:
> 1) Release virtual pmd ports' tx queue in the clean up function
>    remove_slaves_and_stop_bonded_device() of each test cases.
> 2) Do not release allocated mbufs for test bursts.  These mbufs
>    will be released in remove_slaves_and_stop_bonded_device() when
>    test case exits.
> 
> Signed-off-by: Herbert Guan <herbert.guan@arm.com>

Updated unit test causing segfault, before and after patch, am I doing
something wrong?

I will postpone this patch until unit test can be verified.

Thanks,
ferruh