* [dts] [PATCH V1] tests/external_memory:VFIO module parameter increase the allowed limit
@ 2021-03-12 17:12 Chen Lingli
0 siblings, 0 replies; only message in thread
From: Chen Lingli @ 2021-03-12 17:12 UTC (permalink / raw)
To: dts; +Cc: Chen Lingli
According to DPDK commit 016763c219580292c8b05059c7452a7a11d0d19e
VFIO module parameter ``dma_entry_limit`` with a default value of 64K.
When application is out of DMA entries, these limits need to be adjusted to
increase the allowed limit .
Signed-off-by: Chen Lingli <linglix.chen@intel.com>
---
tests/TestSuite_external_memory.py | 1 +
1 file changed, 1 insertion(+)
diff --git a/tests/TestSuite_external_memory.py b/tests/TestSuite_external_memory.py
index 0224a319..e31b2787 100644
--- a/tests/TestSuite_external_memory.py
+++ b/tests/TestSuite_external_memory.py
@@ -111,6 +111,7 @@ class TestExternalMemory(TestCase):
Verifier VFIO_PCI and anonymous memory allocation
"""
self.insmod_modprobe(modename="vfio-pci")
+ self.dut.send_expect("echo 655359 > /sys/module/vfio_iommu_type1/parameters/dma_entry_limit", "#", 10)
self.eal_para = self.dut.create_eal_parameters(cores="1S/4C/1T")
self.dut.send_expect(r'./%s %s -- --mp-alloc=xmem -i'
--
2.17.1
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