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Date: Tue, 13 Dec 2016 14:35:20 +0100 (CET)
From: checkpatch@dpdk.org
Subject: [dpdk-test-report] |SUCCESS| [PATCH v2 05/12] eal: integrate bus
	scan and probe with EAL
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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/17909

_coding style OK_