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Date: Mon, 26 Dec 2016 13:51:07 +0100 (CET)
From: checkpatch@dpdk.org
Subject: [dpdk-test-report] |SUCCESS| pw18524 [PATCH v4 04/12] eal:
	integrate bus scan and probe with EAL
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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/18524

_coding style OK_