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Date: Wed, 18 Jan 2017 11:35:42 +0100 (CET)
From: checkpatch@dpdk.org
Subject: [dpdk-test-report] |SUCCESS| pw19704 [PATCH v9 07/12] eal:
	integrate bus scan and probe with EAL
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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/19704

_coding style OK_