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Date: Fri, 25 Aug 2017 12:31:08 +0200 (CEST)
From: checkpatch@dpdk.org
Subject: [dpdk-test-report] |SUCCESS| pw27944 [PATCH 07/12] bus/vdev: scan
	and probe vdev in secondary processes
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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/27944

_coding style OK_