* |WARNING| pw159143 [PATCH v2 01/10] app/test: make parameters clearer when adding fast tests
[not found] <20251204182047.3154429-2-bruce.richardson@intel.com>
@ 2025-12-04 18:30 ` checkpatch
0 siblings, 0 replies; only message in thread
From: checkpatch @ 2025-12-04 18:30 UTC (permalink / raw)
To: test-report; +Cc: Bruce Richardson
Test-Label: checkpatch
Test-Status: WARNING
http://dpdk.org/patch/159143
_coding style issues_
WARNING:MACRO_ARG_UNUSED: Argument 'no_huge' is not used in function-like macro
#232: FILE: app/test/test.h:219:
+#define REGISTER_FAST_TEST(cmd, no_huge, ASan, func) REGISTER_TEST_COMMAND(cmd, func)
WARNING:MACRO_ARG_UNUSED: Argument 'ASan' is not used in function-like macro
#232: FILE: app/test/test.h:219:
+#define REGISTER_FAST_TEST(cmd, no_huge, ASan, func) REGISTER_TEST_COMMAND(cmd, func)
WARNING:LONG_LINE: line length of 106 exceeds 100 columns
#556: FILE: app/test/test_event_eth_tx_adapter.c:1013:
+REGISTER_FAST_TEST(event_eth_tx_adapter_autotest, NOHUGE_SKIP, ASAN_OK, test_event_eth_tx_adapter_common);
total: 0 errors, 3 warnings, 655 lines checked
^ permalink raw reply [flat|nested] only message in thread