From: Honnappa Nagarahalli <Honnappa.Nagarahalli@arm.com>
To: David Marchand <david.marchand@redhat.com>,
"thomas@monjalon.net" <thomas@monjalon.net>,
"Yigit, Ferruh" <ferruh.yigit@intel.com>,
"jerinj@marvell.com" <jerinj@marvell.com>,
"hemant.agrawal@nxp.com" <hemant.agrawal@nxp.com>,
"Nipun.gupta@nxp.com" <nipun.gupta@nxp.com>,
Pavan Nikhilesh <pbhagavatula@marvell.com>
Cc: dev <dev@dpdk.org>,
Lukasz Wojciechowski <l.wojciechow@partner.samsung.com>,
Aaron Conole <aconole@redhat.com>, nd <nd@arm.com>,
Honnappa Nagarahalli <Honnappa.Nagarahalli@arm.com>,
nd <nd@arm.com>
Subject: Re: [dpdk-dev] [PATCH] eal: change the log level for test assert macro
Date: Thu, 16 Jul 2020 18:41:48 +0000 [thread overview]
Message-ID: <DB6PR0802MB2216C821D4BC58CCD2949F22987F0@DB6PR0802MB2216.eurprd08.prod.outlook.com> (raw)
In-Reply-To: <CAJFAV8yDHPizra4xnUWH8uT3QF9tAXpnVe9NETSQCnmHc7zkGw@mail.gmail.com>
<snip>
> Subject: Re: [PATCH] eal: change the log level for test assert macro
>
> On Wed, Jul 15, 2020 at 10:20 PM Honnappa Nagarahalli
> <honnappa.nagarahalli@arm.com> wrote:
> >
> > Change the log level for RTE_TEST_ASSERT macro to error to help log
> > errors while running test cases.
> >
> > Signed-off-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
> > ---
> > lib/librte_eal/include/rte_test.h | 2 +-
> > 1 file changed, 1 insertion(+), 1 deletion(-)
> >
> > diff --git a/lib/librte_eal/include/rte_test.h
> > b/lib/librte_eal/include/rte_test.h
> > index 89e47f47a..62c8f165a 100644
> > --- a/lib/librte_eal/include/rte_test.h
> > +++ b/lib/librte_eal/include/rte_test.h
> > @@ -18,7 +18,7 @@
> >
> > #define RTE_TEST_ASSERT(cond, msg, ...) do { \
> > if (!(cond)) { \
> > - RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: " \
> > + RTE_LOG(ERR, EAL, "Test assert %s line %d failed: " \
> > msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
> > RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__); \
> > return -1; \
> > --
> > 2.17.1
> >
>
> I proposed it, so I can't disagree :-)
Forgot to add you to suggested-by. Fixed it in v2 😊
>
> RTE_TEST_ASSERT* are used in eventdev driver selftests.
> I don't see why more output in error cases would be detrimental.
> Any objection?
>
> Thanks.
>
> --
> David Marchand
next prev parent reply other threads:[~2020-07-16 18:42 UTC|newest]
Thread overview: 8+ messages / expand[flat|nested] mbox.gz Atom feed top
[not found] <CGME20200715202024eucas1p2d1ddce75f7e5b1181d7a8f29b50fc4b5@eucas1p2.samsung.com>
2020-07-15 20:20 ` Honnappa Nagarahalli
2020-07-16 13:00 ` Aaron Conole
2020-07-16 18:40 ` Honnappa Nagarahalli
2020-07-16 15:06 ` David Marchand
2020-07-16 18:41 ` Honnappa Nagarahalli [this message]
2020-07-16 15:16 ` Lukasz Wojciechowski
2020-07-16 18:39 ` [dpdk-dev] [PATCH v2] " Honnappa Nagarahalli
2020-07-17 8:54 ` David Marchand
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