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From: fengchengwen <fengchengwen@huawei.com>
To: Gowrishankar Muthukrishnan <gmuthukrishn@marvell.com>, <dev@dpdk.org>
Cc: <anoobj@marvell.com>, Vamsi Attunuru <vattunuru@marvell.com>,
	Amit Prakash Shukla <amitprakashs@marvell.com>,
	Vidya Sagar Velumuri <vvelumuri@marvell.com>,
	Kevin Laatz <kevin.laatz@intel.com>,
	Bruce Richardson <bruce.richardson@intel.com>
Subject: Re: [PATCH v3 1/3] test/dma: use unit test framework
Date: Mon, 6 Nov 2023 11:47:02 +0800	[thread overview]
Message-ID: <d96ad21d-6505-d32c-d1ea-aa522b238cb3@huawei.com> (raw)
In-Reply-To: <67a9b287681794a30ef68ee34782a59d6d3e009e.1699025423.git.gmuthukrishn@marvell.com>

Hi Gowrishankar,

  Thanks for your works.

On 2023/11/3 23:38, Gowrishankar Muthukrishnan wrote:
> Use unit test framework to execute DMA tests.
> 
> Signed-off-by: Gowrishankar Muthukrishnan <gmuthukrishn@marvell.com>
> Suggested-by: Chengwen Feng <fengchengwen@huawei.com>
> ---
>  app/test/test_dmadev.c     | 240 ++++++++++++++++++++++++++++---------
>  app/test/test_dmadev_api.c |  89 ++++----------
>  2 files changed, 212 insertions(+), 117 deletions(-)
> 
> diff --git a/app/test/test_dmadev.c b/app/test/test_dmadev.c
> index 216f84b6bb..780941fc1e 100644
> --- a/app/test/test_dmadev.c
> +++ b/app/test/test_dmadev.c
> @@ -22,7 +22,9 @@
>  #define COPY_LEN 1024
>  
>  static struct rte_mempool *pool;
> +static int16_t test_dev_id;
>  static uint16_t id_count;
> +static int vchan;
>  
>  enum {
>  	TEST_PARAM_REMOTE_ADDR = 0,
> @@ -61,13 +63,35 @@ print_err(const char *func, int lineno, const char *format, ...)
>  	va_end(ap);
>  }
>  
> +struct runtest_param {
> +	const char *printable;
> +	int (*test_fn)(int16_t dev_id, uint16_t vchan);
> +	int iterations;
> +	int16_t dev_id;
> +	uint16_t vchan;
> +	bool check_err_stats;
> +};
> +
>  static int
> -runtest(const char *printable, int (*test_fn)(int16_t dev_id, uint16_t vchan), int iterations,
> -		int16_t dev_id, uint16_t vchan, bool check_err_stats)
> +runtest(const void *args)
>  {
> +	int (*test_fn)(int16_t dev_id, uint16_t vchan);
> +	const struct runtest_param *param = args;
>  	struct rte_dma_stats stats;
> +	const char *printable;
> +	bool check_err_stats;
> +	int iterations;
> +	int16_t dev_id;
> +	uint16_t vchan;
>  	int i;
>  
> +	printable = param->printable;
> +	iterations = param->iterations;
> +	dev_id = param->dev_id;
> +	vchan = param->vchan;
> +	check_err_stats = param->check_err_stats;
> +	test_fn = param->test_fn;
> +
>  	rte_dma_stats_reset(dev_id, vchan);
>  	printf("DMA Dev %d: Running %s Tests %s\n", dev_id, printable,
>  			check_err_stats ? " " : "(errors expected)");
> @@ -918,9 +942,21 @@ test_m2d_auto_free(int16_t dev_id, uint16_t vchan)
>  }
>  
>  static int
> -test_dmadev_instance(int16_t dev_id)
> +test_dmadev_burst_setup(void)
>  {
> -#define CHECK_ERRS    true
> +	if (rte_dma_burst_capacity(test_dev_id, vchan) < 64) {
> +		printf("DMA Dev %u: insufficient burst capacity (64 required), skipping tests\n",
> +				test_dev_id);
> +		return TEST_SKIPPED;
> +	}
> +
> +	return TEST_SUCCESS;
> +}
> +
> +static int
> +test_dmadev_setup(void)
> +{
> +	int16_t dev_id = test_dev_id;
>  	struct rte_dma_stats stats;
>  	struct rte_dma_info info;
>  	const struct rte_dma_conf conf = { .nb_vchans = 1};
> @@ -928,16 +964,12 @@ test_dmadev_instance(int16_t dev_id)
>  			.direction = RTE_DMA_DIR_MEM_TO_MEM,
>  			.nb_desc = TEST_RINGSIZE,
>  	};
> -	const int vchan = 0;
>  	int ret;
>  
>  	ret = rte_dma_info_get(dev_id, &info);
>  	if (ret != 0)
>  		ERR_RETURN("Error with rte_dma_info_get()\n");
>  
> -	printf("\n### Test dmadev instance %u [%s]\n",
> -			dev_id, info.dev_name);
> -
>  	if (info.max_vchans < 1)
>  		ERR_RETURN("Error, no channels available on device id %u\n", dev_id);
>  
> @@ -976,20 +1008,123 @@ test_dmadev_instance(int16_t dev_id)
>  	if (pool == NULL)
>  		ERR_RETURN("Error with mempool creation\n");
>  
> +	return 0;
> +}
> +
> +static void
> +test_dmadev_teardown(void)
> +{
> +	rte_mempool_free(pool);
> +	rte_dma_stop(test_dev_id);
> +	rte_dma_stats_reset(test_dev_id, vchan);
> +	test_dev_id = -EINVAL;
> +}
> +
> +static int
> +test_dmadev_instance(int16_t dev_id)
> +{
> +#define CHECK_ERRS    true

suggest rm this define

> +	enum {
> +		  TEST_COPY = 0,
> +		  TEST_START,
> +		  TEST_BURST,
> +		  TEST_ERR,
> +		  TEST_FILL,
> +		  TEST_M2D,
> +		  TEST_END
> +	};
> +
> +	struct runtest_param param[TEST_END];
> +	struct rte_dma_info dev_info;
> +	struct unit_test_suite *ts;
> +	struct unit_test_case *tc;
> +	int ret;
> +
> +	if (rte_dma_info_get(dev_id, &dev_info) < 0)
> +		return TEST_SKIPPED;
> +
> +	test_dev_id = dev_id;
> +	vchan = 0;
> +
> +	ts = calloc(1, sizeof(struct unit_test_suite)
> +				+ sizeof(struct unit_test_case) * (TEST_END + 1));
> +
> +	ts->suite_name = "DMA dev instance testsuite";
> +	ts->setup = test_dmadev_setup;
> +	ts->teardown = test_dmadev_teardown;
> +
> +	param[TEST_COPY].printable = "copy";
> +	param[TEST_COPY].test_fn = test_enqueue_copies;
> +	param[TEST_COPY].iterations = 640;
> +	param[TEST_COPY].dev_id = dev_id;
> +	param[TEST_COPY].vchan = vchan;
> +	param[TEST_COPY].check_err_stats = CHECK_ERRS;
> +
> +	param[TEST_START].printable = "stop-start";
> +	param[TEST_START].test_fn = test_stop_start;
> +	param[TEST_START].iterations = 1;
> +	param[TEST_START].dev_id = dev_id;
> +	param[TEST_START].vchan = vchan;
> +	param[TEST_START].check_err_stats = CHECK_ERRS;
> +
> +	param[TEST_BURST].printable = "burst capacity";
> +	param[TEST_BURST].test_fn = test_burst_capacity;
> +	param[TEST_BURST].iterations = 1;
> +	param[TEST_BURST].dev_id = dev_id;
> +	param[TEST_BURST].vchan = vchan;
> +	param[TEST_BURST].check_err_stats = CHECK_ERRS;
> +
> +	param[TEST_ERR].printable = "error handling";
> +	param[TEST_ERR].test_fn = test_completion_handling;
> +	param[TEST_ERR].iterations = 1;
> +	param[TEST_ERR].dev_id = dev_id;
> +	param[TEST_ERR].vchan = vchan;
> +	param[TEST_ERR].check_err_stats = CHECK_ERRS;
> +
> +	param[TEST_FILL].printable = "fill";
> +	param[TEST_FILL].test_fn = test_enqueue_fill;
> +	param[TEST_FILL].iterations = 1;
> +	param[TEST_FILL].dev_id = dev_id;
> +	param[TEST_FILL].vchan = vchan;
> +	param[TEST_FILL].check_err_stats = CHECK_ERRS;
> +
> +	param[TEST_M2D].printable = "m2d_auto_free";
> +	param[TEST_M2D].test_fn = test_m2d_auto_free;
> +	param[TEST_M2D].iterations = 128;
> +	param[TEST_M2D].dev_id = dev_id;
> +	param[TEST_M2D].vchan = vchan;
> +	param[TEST_M2D].check_err_stats = CHECK_ERRS;

The above param was constant for all dmadev, suggest make them as global variable.

> +
> +	for (int i = 0; i < TEST_END; i++) {
> +		tc = &ts->unit_test_cases[i];
> +		tc->setup = NULL;
> +		tc->teardown = NULL;
> +		tc->testcase = NULL;
> +		tc->testcase_with_data = runtest;
> +		tc->data = &param[i];

suggest set name, it could be param[i].printable

> +		tc->enabled = 0;
> +	}
> +
> +	tc = &ts->unit_test_cases[TEST_END];
> +	tc->setup = NULL;
> +	tc->teardown = NULL;
> +	tc->testcase = NULL;
> +	tc->testcase_with_data = NULL;
> +	tc->data = NULL;
> +	tc->enabled = 0;

With above global variable, could use TEST_CASE_WITH_DATA here which pass TEST_XXX as data.

> +
> +	printf("\n### Test dmadev instance %u [%s]\n",
> +		   dev_id, dev_info.dev_name);
> +
>  	/* run the test cases, use many iterations to ensure UINT16_MAX id wraparound */

The comment could consider del or place it to proper context. the same with other comments

> -	if (runtest("copy", test_enqueue_copies, 640, dev_id, vchan, CHECK_ERRS) < 0)
> -		goto err;
> +	ts->unit_test_cases[TEST_COPY].enabled = 1;
>  
>  	/* run tests stopping/starting devices and check jobs still work after restart */
> -	if (runtest("stop-start", test_stop_start, 1, dev_id, vchan, CHECK_ERRS) < 0)
> -		goto err;
> +	ts->unit_test_cases[TEST_START].enabled = 1;
>  
>  	/* run some burst capacity tests */
> -	if (rte_dma_burst_capacity(dev_id, vchan) < 64)
> -		printf("DMA Dev %u: insufficient burst capacity (64 required), skipping tests\n",
> -				dev_id);
> -	else if (runtest("burst capacity", test_burst_capacity, 1, dev_id, vchan, CHECK_ERRS) < 0)
> -		goto err;
> +	ts->unit_test_cases[TEST_BURST].setup = test_dmadev_burst_setup;
> +	ts->unit_test_cases[TEST_BURST].enabled = 1;
>  
>  	/* to test error handling we can provide null pointers for source or dest in copies. This
>  	 * requires VA mode in DPDK, since NULL(0) is a valid physical address.
> @@ -997,55 +1132,40 @@ test_dmadev_instance(int16_t dev_id)
>  	 */
>  	if (rte_eal_iova_mode() != RTE_IOVA_VA)
>  		printf("DMA Dev %u: DPDK not in VA mode, skipping error handling tests\n", dev_id);
> -	else if ((info.dev_capa & RTE_DMA_CAPA_HANDLES_ERRORS) == 0)
> +	else if ((dev_info.dev_capa & RTE_DMA_CAPA_HANDLES_ERRORS) == 0)
>  		printf("DMA Dev %u: device does not report errors, skipping error handling tests\n",
>  				dev_id);
> -	else if (runtest("error handling", test_completion_handling, 1,
> -			dev_id, vchan, !CHECK_ERRS) < 0)
> -		goto err;
> +	else
> +		ts->unit_test_cases[TEST_ERR].enabled = 1;
>  
> -	if ((info.dev_capa & RTE_DMA_CAPA_OPS_FILL) == 0)
> +	if ((dev_info.dev_capa & RTE_DMA_CAPA_OPS_FILL) == 0)
>  		printf("DMA Dev %u: No device fill support, skipping fill tests\n", dev_id);
> -	else if (runtest("fill", test_enqueue_fill, 1, dev_id, vchan, CHECK_ERRS) < 0)
> -		goto err;
> +	else
> +		ts->unit_test_cases[TEST_FILL].enabled = 1;
>  
> -	if ((info.dev_capa & RTE_DMA_CAPA_M2D_AUTO_FREE) &&
> +	if ((dev_info.dev_capa & RTE_DMA_CAPA_M2D_AUTO_FREE) &&
>  	    dma_add_test[TEST_M2D_AUTO_FREE].enabled == true) {
> -		if (runtest("m2d_auto_free", test_m2d_auto_free, 128, dev_id, vchan,
> -			    CHECK_ERRS) < 0)
> -			goto err;
> +		ts->unit_test_cases[TEST_M2D].enabled = 1;
>  	}
>  
> -	rte_mempool_free(pool);
> -
> -	if (rte_dma_stop(dev_id) < 0)
> -		ERR_RETURN("Error stopping device %u\n", dev_id);
> -
> -	rte_dma_stats_reset(dev_id, vchan);
> -	return 0;
> +	ret = unit_test_suite_runner(ts);
> +	test_dev_id = -EINVAL;
> +	free(ts);
>  
> -err:
> -	rte_mempool_free(pool);
> -	rte_dma_stop(dev_id);
> -	return -1;
> +	return ret;
>  }
>  
>  static int
> -test_apis(void)
> +test_apis(const void *args)
>  {
> -	const char *pmd = "dma_skeleton";
> -	int id;
> -	int ret;
> +	const int16_t dev_id = *(const int16_t *)args;
> +	struct rte_dma_info dev_info;
>  
> -	/* attempt to create skeleton instance - ignore errors due to one being already present */
> -	rte_vdev_init(pmd, NULL);
> -	id = rte_dma_get_dev_id_by_name(pmd);
> -	if (id < 0)
> +	if (rte_dma_info_get(dev_id, &dev_info) < 0)
>  		return TEST_SKIPPED;
> -	printf("\n### Test dmadev infrastructure using skeleton driver\n");
> -	ret = test_dma_api(id);
>  
> -	return ret;
> +	printf("\n### Test dmadev infrastructure using %s\n", dev_info.dev_name);

suggest place above printf in the beginning of test_dma_api()

> +	return test_dma_api(dev_id);
>  }
>  
>  static void
> @@ -1088,16 +1208,28 @@ parse_dma_env_var(void)
>  static int
>  test_dma(void)
>  {
> -	int i;
> +	const char *pmd = "dma_skeleton";
> +	int i,  avail;
>  
>  	parse_dma_env_var();
>  
> +	/* attempt to create skeleton instance - ignore errors due to one being already present*/
> +	rte_vdev_init(pmd, NULL);
> +	i = rte_dma_get_dev_id_by_name(pmd);
> +	if (i < 0)
> +		return TEST_SKIPPED;

+1 for place create skeleton invoking here.

> +
>  	/* basic sanity on dmadev infrastructure */
> -	if (test_apis() < 0)
> +	if (test_apis(&i) < 0)
>  		ERR_RETURN("Error performing API tests\n");
>  
> -	if (rte_dma_count_avail() == 0)
> -		return TEST_SKIPPED;
> +	avail = rte_dma_count_avail();
> +	if (avail == 0)
> +		return 0;
> +
> +	i = rte_dma_next_dev(0);
> +	if (avail > 1 && test_apis(&i) < 0)
> +		ERR_RETURN("Error performing API tests\n");

Why only test later dmadev? Maybe it's ok for one of the channels, but should consider multi-vendor DMA devices exist.
So suggest test all or just test skeleton for the API test.

Also, suggest move API related code to test_dmadev_api.c, e.g.:
void
test_api(void)   ---place this function in test_dmadev_api.c
{
	RTE_DMA_FOREACH_DEV(i) {
		// get device info
		// check whether support memory-to-memory, because API test will setup memory-to-memory vchan
		// if not should skip it
		if (test_dma_api(i) < 0)
			ERR_RETURN("Error, test failure for device %d\n", i);
	}
}

>  
>  	RTE_DMA_FOREACH_DEV(i)
>  		if (test_dmadev_instance(i) < 0)
> diff --git a/app/test/test_dmadev_api.c b/app/test/test_dmadev_api.c
> index 4a181af90a..da8fddb3ca 100644
> --- a/app/test/test_dmadev_api.c
> +++ b/app/test/test_dmadev_api.c
> @@ -9,31 +9,22 @@
>  #include <rte_test.h>
>  #include <rte_dmadev.h>
>  
> -extern int test_dma_api(uint16_t dev_id);
> +#include "test.h"
>  
> -#define DMA_TEST_API_RUN(test) \
> -	testsuite_run_test(test, #test)
> +extern int test_dma_api(uint16_t dev_id);
>  
>  #define TEST_MEMCPY_SIZE	1024
>  #define TEST_WAIT_US_VAL	50000
>  
> -#define TEST_SUCCESS 0
> -#define TEST_FAILED  -1
> -
>  static int16_t test_dev_id;
>  static int16_t invalid_dev_id;
>  
>  static char *src;
>  static char *dst;
>  
> -static int total;
> -static int passed;
> -static int failed;
> -
>  static int
> -testsuite_setup(int16_t dev_id)
> +testsuite_setup(void)
>  {
> -	test_dev_id = dev_id;
>  	invalid_dev_id = -1;
>  
>  	src = rte_malloc("dmadev_test_src", TEST_MEMCPY_SIZE, 0);
> @@ -46,10 +37,6 @@ testsuite_setup(int16_t dev_id)
>  		return -ENOMEM;
>  	}
>  
> -	total = 0;
> -	passed = 0;
> -	failed = 0;
> -
>  	/* Set dmadev log level to critical to suppress unnecessary output
>  	 * during API tests.
>  	 */
> @@ -71,25 +58,6 @@ testsuite_teardown(void)
>  	rte_log_set_level_pattern("lib.dmadev", RTE_LOG_INFO);
>  }
>  
> -static void
> -testsuite_run_test(int (*test)(void), const char *name)
> -{
> -	int ret = 0;
> -
> -	if (test) {
> -		ret = test();
> -		if (ret < 0) {
> -			failed++;
> -			printf("%s Failed\n", name);
> -		} else {
> -			passed++;
> -			printf("%s Passed\n", name);
> -		}
> -	}
> -
> -	total++;
> -}
> -
>  static int
>  test_dma_get_dev_id_by_name(void)
>  {
> @@ -301,7 +269,7 @@ setup_one_vchan(void)
>  
>  	ret = rte_dma_info_get(test_dev_id, &dev_info);
>  	RTE_TEST_ASSERT_SUCCESS(ret, "Failed to obtain device info, %d", ret);
> -	dev_conf.nb_vchans = dev_info.max_vchans;
> +	dev_conf.nb_vchans = 1;
>  	ret = rte_dma_configure(test_dev_id, &dev_conf);
>  	RTE_TEST_ASSERT_SUCCESS(ret, "Failed to configure, %d", ret);
>  	vchan_conf.direction = RTE_DMA_DIR_MEM_TO_MEM;
> @@ -537,38 +505,33 @@ test_dma_completed_status(void)
>  	return TEST_SUCCESS;
>  }
>  
> +static struct unit_test_suite dma_api_testsuite = {
> +	.suite_name = "DMA API Test Suite",
> +	.setup = testsuite_setup,
> +	.teardown = testsuite_teardown,
> +	.unit_test_cases = {
> +		TEST_CASE(test_dma_get_dev_id_by_name),
> +		TEST_CASE(test_dma_is_valid_dev),
> +		TEST_CASE(test_dma_count),
> +		TEST_CASE(test_dma_info_get),
> +		TEST_CASE(test_dma_configure),
> +		TEST_CASE(test_dma_vchan_setup),
> +		TEST_CASE(test_dma_start_stop),
> +		TEST_CASE(test_dma_stats),
> +		TEST_CASE(test_dma_dump),
> +		TEST_CASE(test_dma_completed),
> +		TEST_CASE(test_dma_completed_status),
> +		TEST_CASES_END()
> +	}
> +};
> +
>  int
>  test_dma_api(uint16_t dev_id)
>  {
> -	int ret = testsuite_setup(dev_id);
> -	if (ret) {
> -		printf("testsuite setup fail!\n");
> -		return -1;
> -	}
> +	test_dev_id = dev_id;
>  
>  	/* If the testcase exit successfully, ensure that the test dmadev exist
>  	 * and the dmadev is in the stopped state.
>  	 */

I think the above comments could delete or place just before 'static struct unit_test_suite dma_api_testsuite = {'

> -	DMA_TEST_API_RUN(test_dma_get_dev_id_by_name);
> -	DMA_TEST_API_RUN(test_dma_is_valid_dev);
> -	DMA_TEST_API_RUN(test_dma_count);
> -	DMA_TEST_API_RUN(test_dma_info_get);
> -	DMA_TEST_API_RUN(test_dma_configure);
> -	DMA_TEST_API_RUN(test_dma_vchan_setup);
> -	DMA_TEST_API_RUN(test_dma_start_stop);
> -	DMA_TEST_API_RUN(test_dma_stats);
> -	DMA_TEST_API_RUN(test_dma_dump);
> -	DMA_TEST_API_RUN(test_dma_completed);
> -	DMA_TEST_API_RUN(test_dma_completed_status);
> -
> -	testsuite_teardown();
> -
> -	printf("Total tests   : %d\n", total);
> -	printf("Passed        : %d\n", passed);
> -	printf("Failed        : %d\n", failed);
> -
> -	if (failed)
> -		return -1;
> -
> -	return 0;
> +	return unit_test_suite_runner(&dma_api_testsuite);
>  };
> 

For the dmadev, which have API test, memory-to-memory test, memory-to-device test, currently packed into two test-suites,
But I think its better use sub testsuite (could refer test_pdcp.c). Anyway, this is further more, we could do it later.

As the first stage, I think current impl is OK with above comments addressed.

Thanks
Chengwen

  reply	other threads:[~2023-11-06  3:47 UTC|newest]

Thread overview: 39+ messages / expand[flat|nested]  mbox.gz  Atom feed  top
2023-08-10 11:59 [PATCH] test/dma: add test skip status Gowrishankar Muthukrishnan
2023-08-10 12:36 ` [PATCH v2 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-08-10 12:36   ` [PATCH v2 1/3] test/dma: add test skip status Gowrishankar Muthukrishnan
2023-08-10 12:36   ` [PATCH v2 2/3] test/dma: test vchan reconfiguration Gowrishankar Muthukrishnan
2023-08-10 12:36   ` [PATCH v2 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-03 15:38   ` [PATCH v3 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-11-03 15:38     ` [PATCH v3 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-06  3:47       ` fengchengwen [this message]
2023-11-13  9:28         ` [EXT] " Gowrishankar Muthukrishnan
2023-11-03 15:38     ` [PATCH v3 2/3] test/dma: test vchan reconfiguration Gowrishankar Muthukrishnan
2023-11-06  4:06       ` fengchengwen
2023-11-03 15:38     ` [PATCH v3 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-06  6:43       ` fengchengwen
2023-11-13  9:27         ` [EXT] " Gowrishankar Muthukrishnan
2023-11-13 12:53     ` [PATCH v4 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-11-13 12:53       ` [PATCH v4 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-13 12:53       ` [PATCH v4 2/3] test/dma: test multiple vchan Gowrishankar Muthukrishnan
2023-11-13 12:53       ` [PATCH v4 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-16  7:16       ` [PATCH v4 0/3] test/dma: add vchan reconfig and SG tests fengchengwen
2023-11-16 10:40       ` [PATCH v5 " Gowrishankar Muthukrishnan
2023-11-16 10:40         ` [PATCH v5 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-16 10:40         ` [PATCH v5 2/3] test/dma: test multiple vchan Gowrishankar Muthukrishnan
2023-11-16 10:40         ` [PATCH v5 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-16 10:59         ` [PATCH v6 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-11-16 10:59           ` [PATCH v6 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-16 10:59           ` [PATCH v6 2/3] test/dma: test multiple vchan Gowrishankar Muthukrishnan
2023-11-16 10:59           ` [PATCH v6 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-16 13:27           ` [PATCH v7 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-11-16 13:27             ` [PATCH v7 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-16 13:27             ` [PATCH v7 2/3] test/dma: test multiple vchan Gowrishankar Muthukrishnan
2023-11-16 13:27             ` [PATCH v7 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-11-16 17:45             ` [PATCH v8 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2023-11-16 17:45               ` [PATCH v8 1/3] test/dma: use unit test framework Gowrishankar Muthukrishnan
2023-11-16 17:45               ` [PATCH v8 2/3] test/dma: test multiple vchan Gowrishankar Muthukrishnan
2023-11-16 17:45               ` [PATCH v8 3/3] test/dma: add SG copy tests Gowrishankar Muthukrishnan
2023-12-07 10:10               ` [PATCH v8 0/3] test/dma: add vchan reconfig and SG tests Gowrishankar Muthukrishnan
2024-02-05 10:34                 ` Gowrishankar Muthukrishnan
2024-03-06 19:45               ` Thomas Monjalon
2023-10-08  1:51 ` [PATCH] test/dma: add test skip status fengchengwen

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