[dpdk-dev] [PATCH] test: reduce duration for timer autotest

[Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>]

Reduced the test duration of timer_autotest.
The number of iterations was very large to test the timer functionality.
Although the method to identify random timers can be different,
many iterations would be needed for stress or performance test only.

Signed-off-by: Jananee Parthasarathy <jananeex.m.parthasarathy@intel.com>
---
 test/test/test_timer.c | 2 +-
 1 file changed, 1 insertion(+), 1 deletion(-)

diff --git a/test/test/test_timer.c b/test/test/test_timer.c
index e2aab5308..d625f1f4d 100644
--- a/test/test/test_timer.c
+++ b/test/test/test_timer.c
@@ -358,7 +358,7 @@ timer_stress2_main_loop(__attribute__((unused)) void *arg)
 				timer_stress2_cb, NULL);
 
 	/* pick random timer to reset, stopping them first half the time */
-	for (i = 0; i < 100000; i++) {
+	for (i = 0; i < NB_STRESS2_TIMERS; i++) {
 		int r = rand() % NB_STRESS2_TIMERS;
 		if (i % 2)
 			rte_timer_stop(&timers[r]);
-- 
2.13.6