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From: Tyler Retzlaff <roretzla@linux.microsoft.com>
To: dev@dpdk.org
Cc: Tyler Retzlaff <roretzla@linux.microsoft.com>
Subject: [PATCH 2/2] test/bitcount: add bitcount tests
Date: Wed, 23 Nov 2022 14:14:47 -0800
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basic unit test of following functions
rte_clz
rte_clzl
rte_clzll
rte_ctz
rte_ctzl
rte_ctzll
Signed-off-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
---
app/test/meson.build | 2 ++
app/test/test_bitcount.c | 92 ++++++++++++++++++++++++++++++++++++++++++++++++
2 files changed, 94 insertions(+)
create mode 100644 app/test/test_bitcount.c
diff --git a/app/test/meson.build b/app/test/meson.build
index f34d19e..d1277bc 100644
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -13,6 +13,7 @@ test_sources = files(
'test_alarm.c',
'test_atomic.c',
'test_barrier.c',
+ 'test_bitcount.c',
'test_bitops.c',
'test_bitmap.c',
'test_bpf.c',
@@ -160,6 +161,7 @@ test_deps += ['bus_pci', 'bus_vdev']
fast_tests = [
['acl_autotest', true, true],
['atomic_autotest', false, true],
+ ['bitcount_autotest', true, true],
['bitmap_autotest', true, true],
['bpf_autotest', true, true],
['bpf_convert_autotest', true, true],
diff --git a/app/test/test_bitcount.c b/app/test/test_bitcount.c
new file mode 100644
index 0000000..7b71fdf
--- /dev/null
+++ b/app/test/test_bitcount.c
@@ -0,0 +1,92 @@
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright (C) 2022 Microsoft Corporation
+ */
+
+#include <string.h>
+
+#include <rte_bitcount.h>
+#include <rte_debug.h>
+
+#include "test.h"
+
+RTE_LOG_REGISTER(bitcount_logtype_test, test.bitcount, INFO);
+
+static int
+test_clz(void)
+{
+ unsigned int v = 1;
+ RTE_TEST_ASSERT(rte_clz(v) == sizeof(v) * CHAR_BIT - 1,
+ "Unexpected count.");
+
+ return 0;
+}
+
+static int
+test_clzl(void)
+{
+ unsigned long v = 1;
+ RTE_TEST_ASSERT(rte_clzl(v) == sizeof(v) * CHAR_BIT - 1,
+ "Unexpected count.");
+
+ return 0;
+}
+
+static int
+test_clzll(void)
+{
+ unsigned long long v = 1;
+ RTE_TEST_ASSERT(rte_clzll(v) == sizeof(v) * CHAR_BIT - 1,
+ "Unexpected count.");
+
+ return 0;
+}
+
+static int
+test_ctz(void)
+{
+ unsigned int v = 2;
+ RTE_TEST_ASSERT(rte_ctz(v) == 1, "Unexpected count.");
+
+ return 0;
+}
+
+static int
+test_ctzl(void)
+{
+ unsigned long v = 2;
+ RTE_TEST_ASSERT(rte_ctzl(v) == 1, "Unexpected count.");
+
+ return 0;
+}
+
+static int
+test_ctzll(void)
+{
+ unsigned long long v = 2;
+ RTE_TEST_ASSERT(rte_ctzll(v) == 1, "Unexpected count.");
+
+ return 0;
+}
+
+static struct unit_test_suite bitcount_test_suite = {
+ .suite_name = "bitcount autotest",
+ .setup = NULL,
+ .teardown = NULL,
+ .unit_test_cases = {
+ TEST_CASE(test_clz),
+ TEST_CASE(test_clzl),
+ TEST_CASE(test_clzll),
+ TEST_CASE(test_ctz),
+ TEST_CASE(test_ctzl),
+ TEST_CASE(test_ctzll),
+ TEST_CASES_END()
+ }
+};
+
+static int
+test_bitcount(void)
+{
+ return unit_test_suite_runner(&bitcount_test_suite);
+}
+
+REGISTER_TEST_COMMAND(bitcount_autotest, test_bitcount);
--
1.8.3.1