[PATCH v2 2/2] test/bitcount: add bitcount tests

[Tyler Retzlaff <roretzla@linux.microsoft.com>]

basic unit test of following functions

    rte_clz
    rte_clzl
    rte_clzll
    rte_ctz
    rte_ctzl
    rte_ctzll

Signed-off-by: Tyler Retzlaff <roretzla@linux.microsoft.com>
---
 app/test/meson.build     |  2 ++
 app/test/test_bitcount.c | 92 ++++++++++++++++++++++++++++++++++++++++++++++++
 2 files changed, 94 insertions(+)
 create mode 100644 app/test/test_bitcount.c

diff --git a/app/test/meson.build b/app/test/meson.build
index f34d19e..d1277bc 100644
--- a/app/test/meson.build
+++ b/app/test/meson.build
@@ -13,6 +13,7 @@ test_sources = files(
         'test_alarm.c',
         'test_atomic.c',
         'test_barrier.c',
+        'test_bitcount.c',
         'test_bitops.c',
         'test_bitmap.c',
         'test_bpf.c',
@@ -160,6 +161,7 @@ test_deps += ['bus_pci', 'bus_vdev']
 fast_tests = [
         ['acl_autotest', true, true],
         ['atomic_autotest', false, true],
+        ['bitcount_autotest', true, true],
         ['bitmap_autotest', true, true],
         ['bpf_autotest', true, true],
         ['bpf_convert_autotest', true, true],
diff --git a/app/test/test_bitcount.c b/app/test/test_bitcount.c
new file mode 100644
index 0000000..7b71fdf
--- /dev/null
+++ b/app/test/test_bitcount.c
@@ -0,0 +1,92 @@
+/* SPDX-License-Identifier: BSD-3-Clause
+ * Copyright (C) 2022 Microsoft Corporation
+ */
+
+#include <string.h>
+
+#include <rte_bitcount.h>
+#include <rte_debug.h>
+
+#include "test.h"
+
+RTE_LOG_REGISTER(bitcount_logtype_test, test.bitcount, INFO);
+
+static int
+test_clz(void)
+{
+	unsigned int v = 1;
+	RTE_TEST_ASSERT(rte_clz(v) == sizeof(v) * CHAR_BIT - 1,
+	    "Unexpected count.");
+
+	return 0;
+}
+
+static int
+test_clzl(void)
+{
+	unsigned long v = 1;
+	RTE_TEST_ASSERT(rte_clzl(v) == sizeof(v) * CHAR_BIT - 1,
+	    "Unexpected count.");
+
+	return 0;
+}
+
+static int
+test_clzll(void)
+{
+	unsigned long long v = 1;
+	RTE_TEST_ASSERT(rte_clzll(v) == sizeof(v) * CHAR_BIT - 1,
+	    "Unexpected count.");
+
+	return 0;
+}
+
+static int
+test_ctz(void)
+{
+	unsigned int v = 2;
+	RTE_TEST_ASSERT(rte_ctz(v) == 1, "Unexpected count.");
+
+	return 0;
+}
+
+static int
+test_ctzl(void)
+{
+	unsigned long v = 2;
+	RTE_TEST_ASSERT(rte_ctzl(v) == 1, "Unexpected count.");
+
+	return 0;
+}
+
+static int
+test_ctzll(void)
+{
+	unsigned long long v = 2;
+	RTE_TEST_ASSERT(rte_ctzll(v) == 1, "Unexpected count.");
+
+	return 0;
+}
+
+static struct unit_test_suite bitcount_test_suite = {
+	.suite_name = "bitcount autotest",
+	.setup = NULL,
+	.teardown = NULL,
+	.unit_test_cases = {
+		TEST_CASE(test_clz),
+		TEST_CASE(test_clzl),
+		TEST_CASE(test_clzll),
+		TEST_CASE(test_ctz),
+		TEST_CASE(test_ctzl),
+		TEST_CASE(test_ctzll),
+		TEST_CASES_END()
+	}
+};
+
+static int
+test_bitcount(void)
+{
+	return unit_test_suite_runner(&bitcount_test_suite);
+}
+
+REGISTER_TEST_COMMAND(bitcount_autotest, test_bitcount);
-- 
1.8.3.1