[dpdk-dev] [PATCH] test/crypto: remove repeated test and enable on QAT

[dpdk-dev] [PATCH] test/crypto: remove repeated test and enable on QAT

[Adam Dybkowski]

Remove one AES GCM scatter-gather unit test repetition
and enable this test on QAT (after a fix included in the commit
b26ef1a11f21).

Fixes: 280dce9a0f6d ("test/crypto: add capability checks")
Fixes: b26ef1a11f21 ("test/crypto: fix missing operation status check")

Signed-off-by: Adam Dybkowski <adamx.dybkowski@intel.com>
---
 app/test/test_cryptodev.c | 7 -------
 1 file changed, 7 deletions(-)

diff --git a/app/test/test_cryptodev.c b/app/test/test_cryptodev.c
index 749c3c1b2..12c113848 100644
--- a/app/test/test_cryptodev.c
+++ b/app/test/test_cryptodev.c
@@ -11158,11 +11158,6 @@ test_AES_GCM_auth_encrypt_SGL_out_of_place_1500B_2000B(void)
 static int
 test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_1seg(void)
 {
-	/* This test is not for QAT PMD */
-	if (gbl_driver_id == rte_cryptodev_driver_id_get(
-			RTE_STR(CRYPTODEV_NAME_QAT_SYM_PMD)))
-		return -ENOTSUP;
-
 	return test_authenticated_encryption_SGL(
 			&gcm_test_case_8, OUT_OF_PLACE, 400,
 			gcm_test_case_8.plaintext.len);
@@ -11617,8 +11612,6 @@ static struct unit_test_suite cryptodev_testsuite  = {
 		/** AES GCM Authenticated Encryption */
 		TEST_CASE_ST(ut_setup, ut_teardown,
 			test_AES_GCM_auth_encrypt_SGL_in_place_1500B),
-		TEST_CASE_ST(ut_setup, ut_teardown,
-			test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_1seg),
 		TEST_CASE_ST(ut_setup, ut_teardown,
 			test_AES_GCM_auth_encrypt_SGL_out_of_place_400B_400B),
 		TEST_CASE_ST(ut_setup, ut_teardown,
-- 
2.17.1