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From: Naga Harish K S V <s.v.naga.harish.k@intel.com>
To: jerinj@marvell.com,
jay.jayatheerthan@intel.com
Cc: dev@dpdk.org
Date: Tue, 5 Oct 2021 23:02:53 -0500
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<20211006040256.1443140-1-s.v.naga.harish.k@intel.com>
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Subject: [dpdk-dev] [PATCH v7 2/5] test/event: add unit test for Rx adapter
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this patch adds unit test for rte_event_eth_rx_adapter_create_with_params
api and validate all possible input combinations.
Signed-off-by: Naga Harish K S V <s.v.naga.harish.k@intel.com>
---
app/test/test_event_eth_rx_adapter.c | 53 +++++++++++++++++++++++++---
1 file changed, 49 insertions(+), 4 deletions(-)
diff --git a/app/test/test_event_eth_rx_adapter.c b/app/test/test_event_eth_rx_adapter.c
index 13664a3a3b..7c2cf0dd70 100644
--- a/app/test/test_event_eth_rx_adapter.c
+++ b/app/test/test_event_eth_rx_adapter.c
@@ -428,6 +428,50 @@ adapter_create_free(void)
return TEST_SUCCESS;
}
+static int
+adapter_create_free_with_params(void)
+{
+ int err;
+
+ struct rte_event_port_conf rx_p_conf = {
+ .dequeue_depth = 8,
+ .enqueue_depth = 8,
+ .new_event_threshold = 1200,
+ };
+
+ struct rte_event_eth_rx_adapter_params rxa_params = {
+ .event_buf_size = 1024
+ };
+
+ err = rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+ TEST_DEV_ID, NULL, NULL);
+ TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
+
+ err = rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+ TEST_DEV_ID, &rx_p_conf, &rxa_params);
+ TEST_ASSERT(err == 0, "Expected 0 got %d", err);
+
+ err = rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+ TEST_DEV_ID, &rx_p_conf, &rxa_params);
+ TEST_ASSERT(err == -EEXIST, "Expected -EEXIST %d got %d", -EEXIST, err);
+
+ rxa_params.event_buf_size = 0;
+ err = rte_event_eth_rx_adapter_create_with_params(TEST_INST_ID,
+ TEST_DEV_ID, &rx_p_conf, &rxa_params);
+ TEST_ASSERT(err == -EINVAL, "Expected -EINVAL got %d", err);
+
+ err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
+ TEST_ASSERT(err == 0, "Expected 0 got %d", err);
+
+ err = rte_event_eth_rx_adapter_free(TEST_INST_ID);
+ TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -EINVAL, err);
+
+ err = rte_event_eth_rx_adapter_free(1);
+ TEST_ASSERT(err == -EINVAL, "Expected -EINVAL %d got %d", -EINVAL, err);
+
+ return TEST_SUCCESS;
+}
+
static int
adapter_queue_add_del(void)
{
@@ -435,7 +479,7 @@ adapter_queue_add_del(void)
struct rte_event ev;
uint32_t cap;
- struct rte_event_eth_rx_adapter_queue_conf queue_config;
+ struct rte_event_eth_rx_adapter_queue_conf queue_config = {0};
err = rte_event_eth_rx_adapter_caps_get(TEST_DEV_ID, TEST_ETHDEV_ID,
&cap);
@@ -523,7 +567,7 @@ adapter_multi_eth_add_del(void)
uint16_t port_index, port_index_base, drv_id = 0;
char driver_name[50];
- struct rte_event_eth_rx_adapter_queue_conf queue_config;
+ struct rte_event_eth_rx_adapter_queue_conf queue_config = {0};
ev.queue_id = 0;
ev.sched_type = RTE_SCHED_TYPE_ATOMIC;
@@ -594,7 +638,7 @@ adapter_intr_queue_add_del(void)
struct rte_event ev;
uint32_t cap;
uint16_t eth_port;
- struct rte_event_eth_rx_adapter_queue_conf queue_config;
+ struct rte_event_eth_rx_adapter_queue_conf queue_config = {0};
if (!default_params.rx_intr_port_inited)
return 0;
@@ -687,7 +731,7 @@ adapter_start_stop(void)
ev.sched_type = RTE_SCHED_TYPE_ATOMIC;
ev.priority = 0;
- struct rte_event_eth_rx_adapter_queue_conf queue_config;
+ struct rte_event_eth_rx_adapter_queue_conf queue_config = {0};
queue_config.rx_queue_flags = 0;
if (default_params.caps &
@@ -774,6 +818,7 @@ static struct unit_test_suite event_eth_rx_tests = {
.teardown = testsuite_teardown,
.unit_test_cases = {
TEST_CASE_ST(NULL, NULL, adapter_create_free),
+ TEST_CASE_ST(NULL, NULL, adapter_create_free_with_params),
TEST_CASE_ST(adapter_create, adapter_free,
adapter_queue_add_del),
TEST_CASE_ST(adapter_create, adapter_free,
--
2.25.1