Re: [dpdk-dev] [PATCH v2 0/4] DPDK memcpy optimization

[Thomas Monjalon <thomas.monjalon@6wind.com>]

> > This patch set optimizes memcpy for DPDK for both SSE and AVX platforms.
> > It also extends memcpy test coverage with unaligned cases and more test
> > points.
> > 
> > Optimization techniques are summarized below:
> > 
> > 1. Utilize full cache bandwidth
> > 
> > 2. Enforce aligned stores
> > 
> > 3. Apply load address alignment based on architecture features
> > 
> > 4. Make load/store address available as early as possible
> > 
> > 5. General optimization techniques like inlining, branch reducing, prefetch
> > pattern access
> > 
> > --------------
> > Changes in v2:
> > 
> > 1. Reduced constant test cases in app/test/test_memcpy_perf.c for fast
> > build
> > 
> > 2. Modified macro definition for better code readability & safety
> > 
> > Zhihong Wang (4):
> >   app/test: Disabled VTA for memcpy test in app/test/Makefile
> >   app/test: Removed unnecessary test cases in app/test/test_memcpy.c
> >   app/test: Extended test coverage in app/test/test_memcpy_perf.c
> >   lib/librte_eal: Optimized memcpy in arch/x86/rte_memcpy.h for both SSE
> >     and AVX platforms
> 
> Acked-by: Pablo de Lara <pablo.de.lara.guarch@intel.com>

Applied, thanks for the great work!

Note: we are still looking for a maintainer of x86 EAL.