> Subject: [PATCH v2 0/7] Improvements and new test cases
> 
> v2:
> * Remove unused variables from tests for padding corruption.
> 
> Adding new test cases and improvements to test application.
> 
> Aakash Sasidharan (4):
>   test/crypto: add combined mode cases for TLS 1.3
>   test/security: add TLS 1.3 data walkthrough tests
>   test/security: add out of place sgl tests for TLS
>   test/security: use single session in data walkthrough test
> 
> Vidya Sagar Velumuri (3):
>   test/crypto: unit tests for padding for TLS-1.3
>   test/crypto: verify padding corruption in TLS-1.2
>   test/crypto: verify padding corruption in DTLS-1.2
> 
>  app/test/test_cryptodev.c                     | 214 ++++++++++++++++--
>  app/test/test_cryptodev_security_tls_record.c |   7 +
>  app/test/test_cryptodev_security_tls_record.h |   2 +
>  3 files changed, 201 insertions(+), 22 deletions(-)
> 
Series Acked-by: Akhil Goyal <gakhil@marvell.com>

Applied to dpdk-next-crypto

Changed patch titles. Please review and take care in future.