RE: [PATCH] test/event: increase default queue depth for tests

["Gujjar, Abhinandan S" <abhinandan.gujjar@intel.com>]

Acked-by: Abhinandan Gujjar <abhinandan.gujjar@intel.com>

> -----Original Message-----
> From: Anoob Joseph <anoobj@marvell.com>
> Sent: Wednesday, June 19, 2024 12:03 PM
> To: Gujjar, Abhinandan S <abhinandan.gujjar@intel.com>; Akhil Goyal
> <gakhil@marvell.com>
> Cc: Jerin Jacob <jerinj@marvell.com>; dev@dpdk.org
> Subject: [PATCH] test/event: increase default queue depth for tests
> 
> With crypto adapter, larger queue depths are desirable since same queue could
> be used from multiple cores at the same time. With devices that are capable of
> doing large bursts, larger queues would help in multi core management of same
> queue.
> 
> Increase default queue depth in crypto adapter tests to cater to such use cases.
> 
> Signed-off-by: Anoob Joseph <anoobj@marvell.com>
> ---
>  app/test/test_event_crypto_adapter.c | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
> 
> diff --git a/app/test/test_event_crypto_adapter.c
> b/app/test/test_event_crypto_adapter.c
> index 0c56744ba0..9d38a66bfa 100644
> --- a/app/test/test_event_crypto_adapter.c
> +++ b/app/test/test_event_crypto_adapter.c
> @@ -32,7 +32,7 @@ test_event_crypto_adapter(void)
>  #define NUM_MBUFS                 (8191)
>  #define MBUF_CACHE_SIZE           (256)
>  #define MAXIMUM_IV_LENGTH         (16)
> -#define DEFAULT_NUM_OPS_INFLIGHT  (128)
> +#define DEFAULT_NUM_OPS_INFLIGHT   1024
>  #define MAX_NB_SESSIONS            4
>  #define TEST_APP_PORT_ID           0
>  #define TEST_APP_EV_QUEUE_ID       0
> --
> 2.45.2