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Date: Sat, 8 Feb 2025 08:52:42 +0800
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Subject: Re: [PATCH v4] test: improve resiliency of malloc autotest
To: Bruce Richardson <bruce.richardson@intel.com>, <dev@dpdk.org>
CC: <stable@dpdk.org>
References: <20250117125912.985475-1-bruce.richardson@intel.com>
 <20250207143234.850682-1-bruce.richardson@intel.com>
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From: fengchengwen <fengchengwen@huawei.com>
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Acked-by: Chengwen Feng <fengchengwen@huawei.com>

On 2025/2/7 22:32, Bruce Richardson wrote:
> The test case "test_multi_alloc_statistics" was brittle in that it did
> some allocations and frees and then checked statistics without
> considering the initial state of the malloc heaps. This meant that,
> depending on what allocations/frees were done beforehand, the test can
> sometimes fail.
> 
> We can improve resiliency by running the test using a new malloc heap,
> which means it is unaffected by any previous allocations.
> 
> Bugzilla ID: 1579
> Fixes: a40a1f8231b4 ("app: various tests update")
> Cc: stable@dpdk.org
> 
> Signed-off-by: Bruce Richardson <bruce.richardson@intel.com>