Test-Label: Intel-dts-format-test
Test-Status: SUCCESS
http://dpdk.org/patch/125366
Subject: [V3,7/7] tests/vf_pmd_stacked_bonded: add cases to test vf bonded

_Testing OK_

Diff:
	test_plans/index.rst
	test_plans/vf_pmd_bonded_test_plan.rst
	tests/TestSuite_vf_pmd_bonded.py
	test_plans/vf_pmd_bonded_8023ad_test_plan.rst
	tests/TestSuite_vf_pmd_bonded_8023ad.py
	test_plans/vf_pmd_stacked_bonded_test_plan.rst
	tests/TestSuite_vf_pmd_stacked_bonded.py

DPDK:
	commit 33949800f1afcb7527b6e36c60c1548687ccb673
	Author: Thomas Monjalon <thomas@monjalon.net>
	Date:   Mon Mar 20 17:21:35 2023 +0100
	Comment: version: 23.03-rc3

DTS:
	commit 964b48e223f9f3d4f1fe60502f40be7f85a9f661
	Author: Song Jiale <songx.jiale@intel.com>
	Date:   Mon Jan 16 15:00:02 2023 +0000
	Comment: tests/shutdown_api: modify the command to adapt to the changes in ethtool

DPDK STV team