Test-Label: iol-testing Test-Status: WARNING http://dpdk.org/patch/100651 _apply patch failure_ Submitter: Chautru, Nicolas Date: Wednesday, October 06 2021 20:58:49 Applied on: CommitID:2700326085033fd13339a8de31f58a95d1ee9c3f Apply patch set 100651 failed: Checking patch doc/guides/rel_notes/release_21_11.rst... error: while searching for: * bbdev: Added capability related to more comprehensive CRC options. ABI Changes ----------- error: patch failed: doc/guides/rel_notes/release_21_11.rst:191 Checking patch drivers/baseband/acc100/rte_acc100_pmd.c... Hunk #1 succeeded at 1088 (offset -1 lines). Checking patch drivers/baseband/fpga_5gnr_fec/rte_fpga_5gnr_fec.c... Checking patch drivers/baseband/fpga_lte_fec/fpga_lte_fec.c... Checking patch drivers/baseband/turbo_sw/bbdev_turbo_software.c... Hunk #1 succeeded at 251 (offset -2 lines). Checking patch lib/bbdev/rte_bbdev.h... Applying patch doc/guides/rel_notes/release_21_11.rst with 1 reject... Rejected hunk #1. Applied patch drivers/baseband/acc100/rte_acc100_pmd.c cleanly. Applied patch drivers/baseband/fpga_5gnr_fec/rte_fpga_5gnr_fec.c cleanly. Applied patch drivers/baseband/fpga_lte_fec/fpga_lte_fec.c cleanly. Applied patch drivers/baseband/turbo_sw/bbdev_turbo_software.c cleanly. Applied patch lib/bbdev/rte_bbdev.h cleanly. diff a/doc/guides/rel_notes/release_21_11.rst b/doc/guides/rel_notes/release_21_11.rst (rejected hunks) @@ -191,6 +191,7 @@ API Changes * bbdev: Added capability related to more comprehensive CRC options. +* bbdev: Added device info related to data byte endianness processing assumption. ABI Changes ----------- https://lab.dpdk.org/results/dashboard/patchsets/19206/ UNH-IOL DPDK Community Lab