Test-Label: Intel-dts-format-test
Test-Status: SUCCESS
http://dpdk.org/patch/128990
Subject: [V1] test_plans/vswitch_sample_*: modify testplan contents

_Testing OK_

Diff:
	test_plans/vswitch_sample_dsa_test_plan.rst
	test_plans/vswitch_sample_cbdma_test_plan.rst

DPDK:
	commit 132173c4169322487a9041a450b9d3860de0a434
	Author: Pavan Nikhilesh <pbhagavatula@marvell.com>
	Date:   Tue Jun 13 14:55:48 2023 +0530
	Comment: event/cnxk: use WFE in Tx flow control wait

DTS:
	commit 427e7c3f37bbb1263d81c466d7a83e9193013321
	Author: Hongbo Li <hongbox.li@intel.com>
	Date:   Fri Jun 9 18:10:20 2023 +0800
	Comment: tests/iavf_package_driver_error_handle: support eal_param -a to avoid running containers

DPDK STV team