Test-Label: Intel-dts-doc-test
Test-Status: SUCCESS
http://dpdk.org/patch/110761
Subject: [V3] cvl_switch_filter_test_plan:add pattern any rule test cases

_Testing OK_

Diff:
	test_plans/cvl_switch_filter_test_plan.rst

DPDK:
	commit 28c5d600723a9bb384a4b2f79bf6af8c40950bba
	Author: Tianhao Chai <cth451@gmail.com>
	Date:   Wed May 4 23:39:35 2022 -0500
	Comment: eal: fix C++ include for device event and DMA

DTS:
	commit c918de226ff6305b78288611b407dfc983301e4c
	Author: Zhimin Huang <zhiminx.huang@intel.com>
	Date:   Mon Apr 25 01:03:23 2022 +0800
	Comment: tests/cvl_switch_filter:add new cases about pattern any rule

DPDK STV team