Re: [dpdk-dev] [PATCH] eal: change the log level for test assert macro

[David Marchand <david.marchand@redhat.com>]

On Wed, Jul 15, 2020 at 10:20 PM Honnappa Nagarahalli
<honnappa.nagarahalli@arm.com> wrote:
>
> Change the log level for RTE_TEST_ASSERT macro to error to help
> log errors while running test cases.
>
> Signed-off-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
> ---
>  lib/librte_eal/include/rte_test.h | 2 +-
>  1 file changed, 1 insertion(+), 1 deletion(-)
>
> diff --git a/lib/librte_eal/include/rte_test.h b/lib/librte_eal/include/rte_test.h
> index 89e47f47a..62c8f165a 100644
> --- a/lib/librte_eal/include/rte_test.h
> +++ b/lib/librte_eal/include/rte_test.h
> @@ -18,7 +18,7 @@
>
>  #define RTE_TEST_ASSERT(cond, msg, ...) do {                                  \
>         if (!(cond)) {                                                        \
> -               RTE_LOG(DEBUG, EAL, "Test assert %s line %d failed: "         \
> +               RTE_LOG(ERR, EAL, "Test assert %s line %d failed: "           \
>                                 msg "\n", __func__, __LINE__, ##__VA_ARGS__); \
>                 RTE_TEST_TRACE_FAILURE(__FILE__, __LINE__, __func__);         \
>                 return -1;                                                    \
> --
> 2.17.1
>

I proposed it, so I can't disagree :-)

RTE_TEST_ASSERT* are used in eventdev driver selftests.
I don't see why more output in error cases would be detrimental.
Any objection?

Thanks.

-- 
David Marchand